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Keywords: best error metric, selection, optimizing envelope method, thin film, optical characterization
This work is licensed under a Creative Commons Attribution 4.0 International License.
Selection of Error Metric for ACCURATE Characterization of a Thin Dielectric or Semiconductor Film on Glass Substrate by the Optimizing Envelope Method
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Keywords: best error metric, selection, optimizing envelope method, thin film, optical characterization
How to Cite:
[1] R.N. Nestorov, “Selection of Error Metric for ACCURATE Characterization of a Thin Dielectric or Semiconductor Film on Glass Substrate by the Optimizing Envelope Method,” International Advanced Research Journal in Science, Engineering and Technology (IARJSET), DOI: 10.17148/IARJSET.2020.7301
This work is licensed under a Creative Commons Attribution 4.0 International License.