A NEW SEED FINDING ALGORITHM FOR TESTING VLSI CIRCUITS

V.M.Thoulath Begam

doi:10.17148/IARJSET.2017.41016

← Back to VOLUME 4, ISSUE 10, OCTOBER 2017

A NEW SEED FINDING ALGORITHM FOR TESTING VLSI CIRCUITS

V.M.Thoulath Begam

Downloads: Download PDF|DOI: 10.17148/IARJSET.2017.41016

👁 2 views📥 0 downloads

Abstract:

Keywords:

How to Cite:

[1] V.M.Thoulath Begam, “A NEW SEED FINDING ALGORITHM FOR TESTING VLSI CIRCUITS,” International Advanced Research Journal in Science, Engineering and Technology (IARJSET), DOI: 10.17148/IARJSET.2017.41016

This work is licensed under a Creative Commons Attribution 4.0 International License.